Monday, December 23, 2013
Tuesday, December 17, 2013
FSL3 R&S Rohde and Schwarz 3GHz Spectrum Analyzer - Review of Features at BRL Test
FSL3 R&S Rohde and Schwarz 3GHz Spectrum Analyzer - Review of Features
Need a fast, accurate, versitile, compact and affordable spectrum analyzer that supports 3GPP HSPA, WIMAX, CDMA2000 / 1xEV-DO? Optional tracking generator? If so, the FSL3 by Rohde and Schwarz is what you need. Call your BRL Test represntative today to see if the FSL3 is right for you. 866-275-8378
Need a fast, accurate, versitile, compact and affordable spectrum analyzer that supports 3GPP HSPA, WIMAX, CDMA2000 / 1xEV-DO? Optional tracking generator? If so, the FSL3 by Rohde and Schwarz is what you need. Call your BRL Test represntative today to see if the FSL3 is right for you. 866-275-8378
Thursday, December 12, 2013
Wednesday, December 11, 2013
E4446A Agilent High Performance Spectrum Analyzer 44GHz Review of Features
Agilent E4446A has a wide frequency range that goes up to 44 GHz. With external mixing It can jump up to a whopping 325 GHz. RF and microwave is a piece of cake, millimeter wave signals - no problem. Got complex signals? The E4446A gets it done. Easy for unique setups and to customize for advanced power measurements of modulated signals. Get down to the bit level with digital demodulated personalities. 16 pre-loaded snap easy personalities are optional. Fast throughput, fly between measurement personalities, better yields, less measurement uncertainty, and all in a tight sized package that uses only 7" of rack space.
Ad: Agilent E4446A click here for low price quotes at BRL Test - Sales and Repairs - Data Sheet
Ad: Agilent E4446A click here for low price quotes at BRL Test - Sales and Repairs - Data Sheet
Tuesday, December 10, 2013
E5515C/002/003/GSM/GSM/GPRS/EGPRS/CDMA2000/IS-95/AMPS/WCDMA/HSDPA/FAST SWITCH/UMTS/ v 8 and others..
$2,000 E5515C/002/GSM/GSM/GPRS/ v 4.2 Communications Test Set
$3,000 E5515C/002/CDMA2000/1xEDVO/FAST SWITCH/ v 4.2 Communications Test Set
$3,000 E5515C/002/CDMA2000/1xEDVO/FAST SWITCH/ v 4.2 Communications Test Set
$3,000 E5515C/002/CDMA2000/1xEDVO/v 4.3 Communications Test Set
$3,000 E5515C/002/CDMA2000/1xEDVO/FAST SWITCH/v 4.5 Communications Test Set
$6,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS/CDMA2000/IS-95/AMPS/WCDMA/1xEDVO/FAST SWITCH/ v 4.8
$9,000 E5515C/002/003/GSM/GSM/GPRS/CDMA2000/IS-95/AMPS/WCDMA/1xEDVO/FAST SWITCH/ v.5.5
$11,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS/CDMA2000/MUTI-SYNC/IS-95/AMPS/WCDMA/HSDPA/1xEDVO/FAST SWITCH/FTD/GPS SOURCE/ v 5.8
$13,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS-PHASE-IQ/CDMA2000/IS-95/AMPS/WCDMA/HSDPA/HSUPA/1xEDVO A-B/FAST SWITCH/FTD/ v 5.8
$14,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS/CDMA2000/IS-95/AMPS/WCDMA/HSDPA/FAST SWITCH/UMTS v8
$3,000 E5515C/002/CDMA2000/1xEDVO/FAST SWITCH/ v 4.2 Communications Test Set
$3,000 E5515C/002/CDMA2000/1xEDVO/FAST SWITCH/ v 4.2 Communications Test Set
$3,000 E5515C/002/CDMA2000/1xEDVO/v 4.3 Communications Test Set
$3,000 E5515C/002/CDMA2000/1xEDVO/FAST SWITCH/v 4.5 Communications Test Set
$6,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS/CDMA2000/IS-95/AMPS/WCDMA/1xEDVO/FAST SWITCH/ v 4.8
$9,000 E5515C/002/003/GSM/GSM/GPRS/CDMA2000/IS-95/AMPS/WCDMA/1xEDVO/FAST SWITCH/ v.5.5
$11,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS/CDMA2000/MUTI-SYNC/IS-95/AMPS/WCDMA/HSDPA/1xEDVO/FAST SWITCH/FTD/GPS SOURCE/ v 5.8
$13,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS-PHASE-IQ/CDMA2000/IS-95/AMPS/WCDMA/HSDPA/HSUPA/1xEDVO A-B/FAST SWITCH/FTD/ v 5.8
$14,000 E5515C/002/003/GSM/GSM/GPRS/EGPRS/CDMA2000/IS-95/AMPS/WCDMA/HSDPA/FAST SWITCH/UMTS v8
Tuesday, November 26, 2013
MSO8104A Agilent Oscilloscope at BRL Test - 1 GHz, 4 CH, 4GSa/s
Detailed, fast and deep. Call your BRL test representative to see if the MSO8104A is the right Oscilloscope for you. 866-275-8378 or click here to view data sheet or to get a great online quote.
Agilent N5171B EXG X-Series RF Analog Signal Generator - BRL Test Sales and Repairs
Agilent N5171B EXG X-Series RF Analog Signal Generator sales and repairs. BRL Test - low prices on premium used. Calibrated and certified with full warranty that is back by our World Class Repair Lab. Click here for data sheet or to get online great price quotes.
See demo on using the option 303 to make the N5171B into 7 function generators.
See demo on using the option 303 to make the N5171B into 7 function generators.
Friday, November 22, 2013
Agilent 81130A Pulse Data Generator Review of Features
Glitch-free timing changes
Now you can sweep your timing values without the danger of spurious pulses or dropouts that could cause measurement errors. (Applies to continuous mode, values < 100 ms, consecutive values between 0.5 and twice the previous value on the 81101A,81104A, 81110A)
Reliable measurements
All models provide clean, accurate pulses with excellent repeatability, thus contributing to measurement integrity. The Agilent 81110A features self- calibration for more accuracy. It also offers a choice of output modules: the Agilent 81111A 165 MHz, 10 V module with variable transitions and the Agilent 81112A 330 MHz, 3.8 V module which has differential outputs and two selectable transition times. The Agilent 81130A offers a choice of output modules: the Agilent 81131A 400 MHz, 3.8 V module and the Agilent 81132A 660 MHz, 2.5 V module which has complementary outputs.
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Easy-to-use
Features such as the clear graphical display, autoset, help, store/recall, preset TTL/ECL levels, selectable units (such as current/voltage, width/duty-cycle), and load compensation ensure a high level of convenience. Smooth integration into automated test systems The Agilent 81100A family can be integrated easily into all phases of test system development. Test programs are 100% upwardly compatible from the Agilent 81101A to the 81104A and from the 81104A to the 81110A, ensuring that growth with future needs is as easy as just exchanging the instruments physically. This results in low integration costs, in addition to low costs of ownership through proven hardware reliability. Emulate the device's environment...Today's devices can require very complex stimuli. To meet this, the Agilent 81130A can sequence and loop its memory for very deep patterns. RZ (return-to-zero), NRZ (non-return-to- zero) and R1 (return-to-one) formats are available. Digital channel addition allows the generation of signals with two different pulse widths and delays or of data rates up to 1.32 Gbit/s in one single channel.
Frequency range
Agilent 81130A is designed and recommended for an operation in the frequency range of 170 kHz to 400/660 MHz. However it can be operated in the extended range down to 1 kHz.
Now you can sweep your timing values without the danger of spurious pulses or dropouts that could cause measurement errors. (Applies to continuous mode, values < 100 ms, consecutive values between 0.5 and twice the previous value on the 81101A,81104A, 81110A)
Reliable measurements
All models provide clean, accurate pulses with excellent repeatability, thus contributing to measurement integrity. The Agilent 81110A features self- calibration for more accuracy. It also offers a choice of output modules: the Agilent 81111A 165 MHz, 10 V module with variable transitions and the Agilent 81112A 330 MHz, 3.8 V module which has differential outputs and two selectable transition times. The Agilent 81130A offers a choice of output modules: the Agilent 81131A 400 MHz, 3.8 V module and the Agilent 81132A 660 MHz, 2.5 V module which has complementary outputs.
AD: Low prices on Sales and Repairs of Agilent 81130A, 81131A and 81132A at BRL Test
Easy-to-use
Features such as the clear graphical display, autoset, help, store/recall, preset TTL/ECL levels, selectable units (such as current/voltage, width/duty-cycle), and load compensation ensure a high level of convenience. Smooth integration into automated test systems The Agilent 81100A family can be integrated easily into all phases of test system development. Test programs are 100% upwardly compatible from the Agilent 81101A to the 81104A and from the 81104A to the 81110A, ensuring that growth with future needs is as easy as just exchanging the instruments physically. This results in low integration costs, in addition to low costs of ownership through proven hardware reliability. Emulate the device's environment...Today's devices can require very complex stimuli. To meet this, the Agilent 81130A can sequence and loop its memory for very deep patterns. RZ (return-to-zero), NRZ (non-return-to- zero) and R1 (return-to-one) formats are available. Digital channel addition allows the generation of signals with two different pulse widths and delays or of data rates up to 1.32 Gbit/s in one single channel.
Frequency range
Agilent 81130A is designed and recommended for an operation in the frequency range of 170 kHz to 400/660 MHz. However it can be operated in the extended range down to 1 kHz.
Tuesday, November 12, 2013
N9010A Agilent Signal Analyzer at BRL Test - Sales and Repairs
N9010A Agilent Signal Analyzer at BRL Test - Sales and Repairs. The N9010A sports 30-ms mode switching, and moves more data or results in less time with the 1000Base-T LAN connection. BRL Test is your headquarters for premium used Agilent Spectrum Analyzers. Save big yet rest easy with a full warranty backed up by the best techs in the business. BRL test's repair lab is World Class! Wouldn't you like a friend like that on your side?
Call your BRL Test representative today to see if the N9010A is the right analyzer for you 866.275.8378
Click here for N9010A data sheet.
Click here for N9010A data sheet.
Monday, November 11, 2013
Parametric Testing / Scribeline Probing / Agilent 4073
From Ira Feldman's blog
IEEE Semiconductor Wafer Test Workshop – Parametric / Scribeline Probing – Session Six (Tuesday)
Here are the highlights from Session Five – Signal Integrity of the 20th annual IEEE Semiconductor Wafer Test Workshop (SWTW) from Tuesday June 8th.
Jay Thomas, Grund Technical Solutions, LLC., “Probe Cards with Modular Integrated Switching Matrices”:
For the last 30 years, most scribeline parametric testing has been approximately 85% Current-Voltage (I-V) testing and 15% Capacitance-Voltage (C-V) testing. For these types of tests a 10 MHz bandwidth switch matrix has been sufficient.
However, some of the larger fabs such as HP, IBM, and Intel have started performing pulsed Current-Voltage (PIV) and electrostatic discharge (ESD) testing. These customers started this type of testing about four years ago unknown to Agilent & Keithley (the two largest DC parametric tester suppliers). This PIV and ESD testing requires high frequency switch matrices with 1 GHz bandwidth. [For more about ESD testing please see Jay’s second presentation below in this session.]
In addition as oxides have become very thin this has made them “leaky”, therefore there is also a need to run higher frequency measurements. Typically the matrix switch needs to be 5x to 10x the bandwidth of the desired test frequency. This is also driving the need for higher bandwidth matrix switches.
Grund has developed a modular stack of a mother board with daughter cards to provide a 1 GHz matrix switch called the Genus matrix system. This stack of printed circuit boards (PCB) sits above the probe card on the prober and provides the necessary high frequency interconnect to the parametric tester and other equipment (ESD source, oscilloscope, etc.).
Ray Robertazzi, IBM Research, “New Directions in Parametric and Defect Structure Testing”:
As feature sizes shrink at the 22 nm process node and below, the variability in basic process measurements increases. Therefore they need to rely on statistical methods instead of a single pass / fail measurement. These statistical methods require a significant numbers of measurements to be valid. However the linear increase in test time due to the additional measurements is unacceptable.
What is needed is the ability to perform a large number of parametric measurements in parallel. The DC parametric testers currently used have the required sensitivity to make measurements in below 1 pA however on only one or two channels. While typical high parallelism logic testers which have thousands of channels that can operate in parallel don’t have the accuracy to measure below 10 nA (i.e. they are four orders of magnitude worse than the parametric testers).
Therefore, Verigy developed a pA source measurement unit (SMU) for their 93000 test system. The Verigy team led by Kosuke Miyao developed a fully integrated solution to provide 100 channels to perform measurements in the 5 pA range. [Kosuke was one of the excellent project managers on the Docking Services team I managed at Agilent. Kosuke: it is always a pleasure to hear a customer gush about how happy they are at the end of a project.] In addition to the SMU, the solution included high parallelism parametric probe cards from JEM, a new low leakage tri-axial pogo tower, and integrated control software.
However, modern test systems suffer from the lack of ability to observe or validate results. In Ray’s opinion test systems are the most complex electromechanical systems every developed by man. IBM under estimated how difficult the validation portion of the project would be. The Verigy validation load board (VLB) was designed to calibrate the SMU in the test system and had no observability for external validation. So in order to validate the test system setup they built a pA diagnostic instrument which allows correlation with a HP 4073 parametric tester and provides National Institute of Standards and Technology (NIST) traceability.
After validating the solution, the system was release to production. In production it has demonstrated a 5x throughput improvement due to the high parallelism in testing and is currently limited by the prober speed.
Jay Thomas, Grund Technical Solutions, LLC., “Wafer Level ESD Probe Card Solutions”:
Production testing of electrostatic discharge (ESD) test structures is a new market. In the past, ESD testing was previously done off line using a manual probe system. Neither Agilent (where he managed parametric testing applications) nor Keithley (to the best of his knowledge) support this in an automated fashion.
The traditional Human Body Model (HBM) provides a high voltage 2 A pulse with a 500 nS decay by discharging a 100 pF capacitor with a 1500 Ohm resistor. [Similar to the shock from running your feet across the carpet then touching another object.] However, the new European standard (required for CE marking) is the Human Metal Model (HMM). The HMM combines the HBM with a Charged Device Model (CDM) to simulate the discharge that might occur from holding an insulated screw driver. His presentation has scanning electron microscope (SEM) images of the different types of damage that is seen based upon the discharge model used.
Companies put ESD test structures in the scribe lines to predict how well the ESD protection circuits will work. Typically the ESD discharge takes place “off line” on an ESD “tester” (actually a discharge setup typically on a manual prober). Then the wafer is put back in the wafer prober and the test structure is tested using a DC parametric tester. Similarly to test actual parts you need to zap the part on the ESD “tester” and then need to test the part with a standard digital/mixed-signal tester to see if it survived. One example shown was a Hanwa system for CDM (about $250K). However, it needs to zap the pins one at a time. And on a 3,000 pin ball grid array (BGA) that would take some time to accomplish.
Through the use of the Genus matrix system (described above in Jay’s first presentation), they are able to integrate ESD discharge equipment in to the parametric test setup. This allows the “zapping” of the test structure and testing of it in an automated fashion without moving the wafer to an offline setup.
Note: I will post the link for the slides once they become available.
IEEE Semiconductor Wafer Test Workshop – Parametric / Scribeline Probing – Session Six (Tuesday)
Here are the highlights from Session Five – Signal Integrity of the 20th annual IEEE Semiconductor Wafer Test Workshop (SWTW) from Tuesday June 8th.
Jay Thomas, Grund Technical Solutions, LLC., “Probe Cards with Modular Integrated Switching Matrices”:
For the last 30 years, most scribeline parametric testing has been approximately 85% Current-Voltage (I-V) testing and 15% Capacitance-Voltage (C-V) testing. For these types of tests a 10 MHz bandwidth switch matrix has been sufficient.
However, some of the larger fabs such as HP, IBM, and Intel have started performing pulsed Current-Voltage (PIV) and electrostatic discharge (ESD) testing. These customers started this type of testing about four years ago unknown to Agilent & Keithley (the two largest DC parametric tester suppliers). This PIV and ESD testing requires high frequency switch matrices with 1 GHz bandwidth. [For more about ESD testing please see Jay’s second presentation below in this session.]
In addition as oxides have become very thin this has made them “leaky”, therefore there is also a need to run higher frequency measurements. Typically the matrix switch needs to be 5x to 10x the bandwidth of the desired test frequency. This is also driving the need for higher bandwidth matrix switches.
Grund has developed a modular stack of a mother board with daughter cards to provide a 1 GHz matrix switch called the Genus matrix system. This stack of printed circuit boards (PCB) sits above the probe card on the prober and provides the necessary high frequency interconnect to the parametric tester and other equipment (ESD source, oscilloscope, etc.).
Ray Robertazzi, IBM Research, “New Directions in Parametric and Defect Structure Testing”:
As feature sizes shrink at the 22 nm process node and below, the variability in basic process measurements increases. Therefore they need to rely on statistical methods instead of a single pass / fail measurement. These statistical methods require a significant numbers of measurements to be valid. However the linear increase in test time due to the additional measurements is unacceptable.
What is needed is the ability to perform a large number of parametric measurements in parallel. The DC parametric testers currently used have the required sensitivity to make measurements in below 1 pA however on only one or two channels. While typical high parallelism logic testers which have thousands of channels that can operate in parallel don’t have the accuracy to measure below 10 nA (i.e. they are four orders of magnitude worse than the parametric testers).
Therefore, Verigy developed a pA source measurement unit (SMU) for their 93000 test system. The Verigy team led by Kosuke Miyao developed a fully integrated solution to provide 100 channels to perform measurements in the 5 pA range. [Kosuke was one of the excellent project managers on the Docking Services team I managed at Agilent. Kosuke: it is always a pleasure to hear a customer gush about how happy they are at the end of a project.] In addition to the SMU, the solution included high parallelism parametric probe cards from JEM, a new low leakage tri-axial pogo tower, and integrated control software.
However, modern test systems suffer from the lack of ability to observe or validate results. In Ray’s opinion test systems are the most complex electromechanical systems every developed by man. IBM under estimated how difficult the validation portion of the project would be. The Verigy validation load board (VLB) was designed to calibrate the SMU in the test system and had no observability for external validation. So in order to validate the test system setup they built a pA diagnostic instrument which allows correlation with a HP 4073 parametric tester and provides National Institute of Standards and Technology (NIST) traceability.
After validating the solution, the system was release to production. In production it has demonstrated a 5x throughput improvement due to the high parallelism in testing and is currently limited by the prober speed.
Jay Thomas, Grund Technical Solutions, LLC., “Wafer Level ESD Probe Card Solutions”:
Production testing of electrostatic discharge (ESD) test structures is a new market. In the past, ESD testing was previously done off line using a manual probe system. Neither Agilent (where he managed parametric testing applications) nor Keithley (to the best of his knowledge) support this in an automated fashion.
The traditional Human Body Model (HBM) provides a high voltage 2 A pulse with a 500 nS decay by discharging a 100 pF capacitor with a 1500 Ohm resistor. [Similar to the shock from running your feet across the carpet then touching another object.] However, the new European standard (required for CE marking) is the Human Metal Model (HMM). The HMM combines the HBM with a Charged Device Model (CDM) to simulate the discharge that might occur from holding an insulated screw driver. His presentation has scanning electron microscope (SEM) images of the different types of damage that is seen based upon the discharge model used.
Companies put ESD test structures in the scribe lines to predict how well the ESD protection circuits will work. Typically the ESD discharge takes place “off line” on an ESD “tester” (actually a discharge setup typically on a manual prober). Then the wafer is put back in the wafer prober and the test structure is tested using a DC parametric tester. Similarly to test actual parts you need to zap the part on the ESD “tester” and then need to test the part with a standard digital/mixed-signal tester to see if it survived. One example shown was a Hanwa system for CDM (about $250K). However, it needs to zap the pins one at a time. And on a 3,000 pin ball grid array (BGA) that would take some time to accomplish.
Through the use of the Genus matrix system (described above in Jay’s first presentation), they are able to integrate ESD discharge equipment in to the parametric test setup. This allows the “zapping” of the test structure and testing of it in an automated fashion without moving the wafer to an offline setup.
Note: I will post the link for the slides once they become available.
Thursday, October 31, 2013
Tuesday, October 29, 2013
Tutorial: Option 303 - Get 7 function Generators in 1! For N5171B, N5172B, N5181B and N5182B X-Series signal generators. Demo with N9030A and MSO8104A
This video reviews the Agilent N5171B EXG analog signal generator's option 303 multi-function generator and how it is set up with N9030A PXA signal analyzer (embedded with 89600 VSA software) and an MSO8104A Oscilloscope to simultaneously analyze a CHIRP radar signal (pulse+FM) from impairment signals of AM noise, AM drift and Frequency drift.
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Monday, October 21, 2013
R&S FSU26 Spectrum Analyzer is simply "The Best."
R&S FSU26 Spectrum Analyzer is simply "The Best."
Monday, October 14, 2013
Agilent E4404B spectrum analyzer sales and repairs at BRL Test - Low Prices!
Agilent E4404B spectrum analyzer sales and repairs at BRL Test. Low prices on premium quality used E4404B's. Freshly calibrated, certified and guaranteed to work accurately right out of the box - no worries. Purchase easy knowing that your full warranty is backed up by our in house repair engineering department . Our military trained techs repair E4404B's at our world class lab. We absolutely know Agilent spectrum analyzers. Ships worldwide from Orlando, FL Florida.
Tuesday, October 8, 2013
Review of FSVR Real Time Spectrum Analyzer by R&S - Capable of locating and drilling down on ultra short sporadic interference events yet maintaining conventional wideband analysis. Video
The R&S FSVR is the first spectrum analyzer to simultaneously capture 2 modes of analysis
- Conventional Hetrodyne Spectrum Analysis
- Real Time
Based on the FSV, the FSVR has the pedigree as the markets fastest and most accurate conventional spectrum analyzer.
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The real time mode is what makes the FSVR exceptional. By seamlessly grabbing RF signals in the time domain and converting them to the frequency domain, it is capable of locating and drilling down on ultra short sporadic interference events yet maintaining conventional wideband analysis. Talk about having your cake and eating it too. See the video and be amazed!
Monday, September 30, 2013
Video tutorial: Agilent N9010A, E8267D, E8257D and 89600 VSA software used to Generate and Analyze Millimeter-Wave Frequencies
Video tutorial: Agilent N9010A X-series signal analyzer, E8267D Vector signal generator, E8257D Analog signal generator and 89600 VSA software used to Generate and Analyze Millimeter-Wave Frequencies. Uses include automotive radar and wireless HD video transmission. This tutorial explains how to set this up for 65 GHz using mixer option H65 and M1970V Waveguide Harmonic Mixer.
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Friday, September 20, 2013
Agilent E8257D Recognized for Passing the test of time.
Agilent E8257D Recognized for Passing the test of time.
Agilent E8257D PSG Test of Time 2012 Finalist awarded by Test and Measurement Magazine.
Honoring great products that continue to deliver state of the art performance 5 years after their introduction. Congratulations Agilent!
.png "Agilent E8257D Test and Measurement Magazine Test of Time Finalist"){kind=logo}
At BRL Test we believe in the relevancy of the Agilent E8257D Signal Generator. Our business strategy has long held that customers should enjoy real savings on premium quality used equipment while resting easy with a full 1 year warranty and lifetime support promise that is backed by our world class repair lab.
The E8257D PSG is a very serious analog signal generator. Choose frequency max up to 67 GHz (operational to 70 GHz). The E8257D PSG high output power and superior level accuracy often does away with the need for an external amplifier for testing high power devices and cuts down on test uncertainty. Great phase noise performance is ideal for local oscillator, low jitter clock substitution and adjacent channel selectivity tests. Professionals choose the E8257D for RF & microwave radar, communications, and control systems testing.
Continuous wave (CW) generation is standard. Optionally add analog and/or pulse modulation to accurately characterize RF and microwave components units. Flexible optional modulation means getting in easy and ramping up when you can afford.
Changing requirements? No problem. Call BRL Test 866-275-8378 and we'll upgrade you to the right options. Configure the E8257D PSG for applications ranging from LO substitution and distortion test to radar test and interference signal generation.©
- Broad frequency ranges - 250 kHz to 20, 40, 50 or 67 GHz (operational to 70 GHz) with .001 Hz resolution
- High output power - typical performance of +23 dBm @ 20 GHz, + 17dBm @ 40 GHz, + 14 dBm @ 67 GHz with excellent level accuracy
- World-class SSB phase noise - typical performance of -115 dBc/Hz at 10 kHz offset from 10 GHz carrier
- Flexible analog modulation formats - AM, FM, ØM, and pulse
- Dual internal function generators - sine, square, triangular, ramp, and noise waveforms
- Easy frequency extension - up to 325 GHz with Oleson Microwave Labs (OML) mm-wave modules
- Narrow pulse modulation - typical 8 ns rise/fall times and 20 ns pulse width from 10 MHz to 67 GHz
- Multiple high rate sweep modes - digital step/list sweep and analog ramp sweep featuring code compatibility with the Agilent 8757D scalar network analyzer
- External control using PSA Series spectrum analyzer – scalar network analysis capability when combined with any PSA with external source control option.
- Backwards compatible - same form factor and 100% code compatible with previous generations of PSG signal generators
- Standard 1 year warranty
Thursday, September 19, 2013
8753D Measuring a Device in the Time Domain (Option 010 Only)
Measuring a Device in the Time Domain (Option 010 )
The HP 8753D Option 010 allows you to measure the time domain response of a device. Time domain analysis is useful for isolating a device problem in time or in distance. Time and distance are related by the velocity factor of your device under test. The analyzer measures the frequency response of your device and uses an inverse Fourier transform to convert the data to the time domain.Gating
Time domain analysis allows you to mathematically remove individual parts of the time domain response to see the undesirable responses...(read more in the Agilent 8753D users manual starting on page 2-68 )
Wednesday, September 18, 2013
Agilent 8722ES Vector Network Analyzer VNA 40GHz - BRL Test
Agilent 8722ES On Sale at BRL Test
 |
| Agilent 8722ES Vector Network Analyzer VNA 40GHz |
The Agilent 8722ES network analyzer is a 40 GHz, S-Parameter VNA that makes quick work of magnitude and phase measurements both forward and reverse.
No long waits for data transfer with this race horse. Sweep fast!
Need time domain? High power? Want Ecal? No problem adding options at BRL Test.
Save on premium quality used 8722ES. Freshly calibrated, certified and guaranteed to work accurately right out of the box - no worries. Purchase easy knowing that your full warranty is backed up by our in house repair engineering department . Our military trained techs repair 8722ES's at our world class lab. We absolutely know Agilent network analyzers.© Call your BRL Test service representative to see if the 8722ES is a good fit for your testing requirements.407-682-4228. Click here for 8722ES quotes now.
Friday, September 13, 2013
Calibrating VNA's such as 8753, ENA and PNA series and RF Network Analyzers using Agilent Electronic (ECal) Modules. Tutorial Video
Watch this tutorial video on how to reduce the number of test port connections required for a standard 4 port calibration from 18 (mechanical old way) down to just 4 using Agilent ECal modules. Calibrate faster, reduce errors and wear on test port connectors and calibration standards by using the ECal module method. Done with traceable, verifiable, electronic impedance standards.
Advertisement: ***Premium Quality Used 8753,ENA and PNA series and RF Network Analyzers - Sales and Repairs - BRL Test 866-275-8378***
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Thursday, September 12, 2013
Review of Agilent E4440A
| Electronic Design
Advanced performance in sophisticated test and measurement equipment generally comes at the price of complexity of use. Adding more features and capabilities to an instrument and its front panel often requires that users take a lot of time to just figure out how to get the most out of that instrument. But a new milestone in both performance and ease of use has been achieved with the E4440A spectrum analyzer from Agilent Technologies, the first in the company's Performance Series Analyzer (PSA) family (Fig. 1).
Digital technology was used to give the instrument what the company claims is "unparalleled performance, enhanced flexibility, and modern connectivity." Because of its flexibility, the E4440A can be employed by a wide variety of designers, from novice to expert, across a number of disciplines like aerospace, communications, R&D, and manufacturing, for both general and highly specialized signal-analysis purposes. The instrument's combination of speed and performance lets designers characterize signals that they couldn't even "see" before. And, it makes possible measurements that are much quicker and more accurate.
Speed, accuracy, dynamic range, resolution, and detection capabilities have all been optimized to what Agilent says are "industry firsts." Without using conventional LC and crystal filters that can slow signals down, the PSA platform doubles the speed of many measurements, permitting faster spur searches than other commercially available spectrum analyzers.
For example, the 30-Hz to 26.5-GHz analyzer features wide-ranging sweep speeds. It can measure very slow sweep speeds to capture intermittent signals. Zero-band sweep speeds range from 1 µs to 6000 seconds. For spans greater than 10 Hz, sweep speeds range from 2 ms to 2000 seconds. Users can trigger the sweeps with video, free-run, line, and external signals, and the trigger can be delayed up to 500 ms.
For example, the 30-Hz to 26.5-GHz analyzer features wide-ranging sweep speeds. It can measure very slow sweep speeds to capture intermittent signals. Zero-band sweep speeds range from 1 µs to 6000 seconds. For spans greater than 10 Hz, sweep speeds range from 2 ms to 2000 seconds. Users can trigger the sweeps with video, free-run, line, and external signals, and the trigger can be delayed up to 500 ms.
Using digital signal processing, the instrument offers 0.35-dB absolute-amplitude accuracy versus the typical 1.5 dB of other instruments, and an impressive 0.2-dB linearity over a 100-dB range. It removes log-fidelity errors almost entirely (0.2 dB total), significantly reduces bandwidth-switching er-rors (0.05 dB), and completely eliminates IF gain errors (0 dB). Therefore, users can operate effectively with closer tolerances and shrink guard bands.
In addition, the E4440A features a distortion-free dynamic range of 113 dB. This is critical for making adjacent-channel pow-er measurements in the cellular telecommunications industry.
The E4440A provides optimized phase-noise capability. Designers can set the analyzer to improve phase noise in the close-in mode to less than 30 kHz. This is particularly useful for identifying low-level signals otherwise hidden under phase-noise skirts. Or, users can choose the auto mode, which is more than 30 kHz, to let the instrument select the phase-noise setting at an optimal speed.
Another important parameter for the E4440A is flexibility, as this allows customizable measurements for both novice and experienced users. Measurements may be fine-tuned with 160 resolution bandwidth settings. Also, users can maximize the usable dynamic range with a 2-dB step attenuator and balance close-in or far-out phase noise (Fig. 2). Note that the industry standard for step attenuation is 10 dB.
Broad and easy connectivity are featured by the E4440A, minimizing the time wasted when getting data into and out of the instrument. The E4440A enables screen and data capture with popular Microsoft applications, and it can connect to LANs for data transfers. Plug-and-play drivers are available for Agilent VEE and other popular test-automation software, in-cluding LabView and LabWindows. Furthermore, the instrument supports popular PCL3 and PCL5 printers using a parallel port.
Unlike the previous-generation Agilent spectrum analyzers based on a 68000 CISC processor, the PSA line of analyzers is based on a RISC processor. By extensive use of digital and DSP technology, Agilent's designers were able to shrink the analyzer's eight internal pc boards from previous-generation units to just one.
A key element in the instrument's performance capability is a 3-GHz preamplifier that improves the digital average-noise level (DANL) to an impressive −153 dBm over a 10-MHz to 3-GHz frequency range, a figure that will be improved to −167 dBm. The preamplifier first feeds its signals to a sophisticated voltage-controlled oscillator (VCO) that actually acts as two VCOs, and then onto a 14-bit, 30-Msample/s analog-to-digital converter (Fig. 3).
Wednesday, September 11, 2013
Friday, September 6, 2013
Spectrum Analyzer -Zero Span operations tutorial video.
Spectrum Analyzer -Zero Span operations tutorial video.
The net effect of how a spectrum analyzer works is to take resolution bandwidth (RBW) filter followed by a detector, swept across a given frequency span. Zero Span is parking that filter at a given frequency and then detecting the amount of power that exists in that filter over time. It's kind of a time domain view of the amplitude variations of a given signal in that filter...(see video for more)
Thursday, September 5, 2013
Video Tutorial on exploring Resolution Bandwidth RBW and Video Bandwidth VBW using the Anritsu MS2721B
Video Tutorial on exploring Resolution Bandwidth RBW and Video Bandwidth VBW using the Anritsu MS2721B.
There is a trade off between sweep speed and resolution bandwidth.
There is a trade off between sweep speed and resolution bandwidth.
Wednesday, September 4, 2013
Agilent E4411B On Sale Now! at BRL Test
Agilent E4411B On Sale Now!
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The Agilent E4411B is a great mid level, 3 GHz Spectrum Analyzer. Click here for datasheet and to get quotes now.
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Tuesday, September 3, 2013
Basic Spectrum Analyzer Do's and Don'ts Video ...E4411B
How not to blow up your spectrum analyzer video. Demonstrated using an Agilent E4411B. Safety begins at the input end. Heed the MAX label on the input or else you may damage your mixer...
Friday, August 30, 2013
N9330B Cable and Antenna Fault Location Basics Tutorial Video.
N9330B Cable and Antenna Fault Location Basics Tutorial Video.
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| Click image to get datasheet and quotes for N9342C |
Agilent N9342C - BRL Test - 866-275-8378!
BRL Test is your source for base station, cable testers and handheld spectrum analyzers by Agilent, Anritsu and BK Precision.
Thursday, August 29, 2013
Agilent 8753ET
Agilent 8753ET - BRL Test - Premium Quality Used
This hardworking, economical network analyzer is easy to use with 4 display channels. Need to have a little more umph? We can upgrade to 6 GHz from 3 Ghz. Time domain (option 010)? No problem! Call BRL Test today for the network analyzer that fits you best 866-275-8378.
Wednesday, August 28, 2013
The Agilent 8564EC boast a beautiful color display, great sensitivity and outstanding phase noise.
The Agilent 8564EC boast a beautiful color display, great sensitivity and outstanding phase noise. With 40 GHz under the hood this precision instrument has enough horsepower to get the job done. Adjecent channel power testing? No problem!
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